imec

ToF-SIMS Metrology Engineer

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As Metrology Engineer, you will perform daily ToF-SIMS analyses and will develop new approaches to address metrology challenges

What you will do

The composition analysis team provides imec-wide support in materials characterization by means of secondary ion mass spectrometry (SIMS) using both Time-of-Flight (ToF-SIMS) and Magnetic Sector (MS-SIMS) instruments. As ToF-SIMS Metrology engineer, you will perform daily ToF-SIMS measurements to support the fab demand, the different R&D activities within imec and the PhD student works. You will also be working closely with the researchers of the SIMS team in developing for example new internal SIMS references, optimizing ToF-SIMS analysis conditions for specific requests, optimizing the ToF-SIMS instrument, ....  

  • You perform daily ToF-SIMS analyses. 
  • You contribute and oversee the execution, interpretation, and reporting of ToF-SIMS analyses, and you advise internal and external customers.  
  • You investigate and develop new methods / approaches to address metrology challenges (e.g. low-dimensional nanostructures).  
  • You document best practices and provide training to the team members. 
  • You contribute to deliverables of funded research projects and programs. 
  • You contribute to internal conferences/workshops. 

The work will consist of experimental work, data analysis and interpretation, interaction with imec engineers/researchers, and of literature studies. As part of the Materials and Component Analysis (MCA) department, it is expected that you gain knowledge in other characterization methods in the MCA department and in the fab, and that you correlate your results to other characterization methods and to the advanced process and device technology.

What we do for you

We offer you the opportunity to join one of the world’s premier research centers in nanotechnology at its headquarters in Leuven, Belgium. With your talent, passion and expertise, you’ll become part of a team that makes the impossible possible. Together, we shape the technology that will define the society of tomorrow. 

We are committed to being an inclusive employer (http://www.imec-int.com/en/careers#diversity) and proud of our open, multicultural, and informal working environment with ample possibilities to take initiative and show responsibility. In everything we do, your future colleagues are guided by the imec values of passion, excellence, connectedness, and integrity. We commit to supporting and guiding you in this process, not only with words but also with tangible actions. Through imec.academy, 'our corporate university', we actively invest in your development to further your technical and personal growth. 

We are aware that your valuable contribution makes imec a top player in its field. Your energy and commitment are therefore appreciated by means of a market appropriate salary with many fringe benefits. 

Who you are

  • You have a Master of Science / Master in Engineering or a PhD in Physics or Chemistry.
  • You have experience in ToF-SIMS (and Scanning Probe Microscopy) in an academic or industrial R&D lab environment.
  • You have strong analytical skills and intellectually creativity.  
  • You show excellent communication and reporting skills as you will be required to interface with internal customers. 
  • Experienced in materials characterization, both experimental and theoretical, is highly valued. 
  • Since you will be working in a highly international environment and will be maintaining a good contact with colleagues and co-workers from all over the world, fluency in English is essential.

Détails de l'offre

Titre
ToF-SIMS Metrology Engineer
Employeur
Localisation
Kapeldreef 75 Louvain, Belgique
Publié
2024-03-25
Date limite d'inscription
Unspecified
Type de poste
Enregistrer le travail

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